Sireda Technology Co.,Limited

siredatech2010.globa(1)

Showing 41 - 50 of 58, total 6 pages [First] [Previous] [Next] [Last]

bga130 socket f solution_8x9mm_premium, emcp test socket
Specification: 702-0000217
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga152 socket f solution_14x18mm_premium
Specification: 702-0000219
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,QF...

bga95 socket f solution_11.5x13mm_premium
Specification: 702-0000266
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga107 socket f solution_11.5x13mm_premium, bga tester
Specification: 702-0000213
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga84/ddr2 socket f solution_8x12.5mm_premium
Specification: 702-0000189
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga134(lpddr) socket f solution_10x11.5mm_premium
Specification: 702-0000211
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga132 socket f solution_12x18mm_premium
Specification: 702-0000220
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga78/ddr3 socket f solution_9x10.5_premium,ddr3 test socket
Specification: 702-0000187
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution Test, debug, validation of devices of BGA,LGA,QFP,...

bga162/bga186/emcp socket sd solution_11.5 x 13_0.5mm_perform
Specification: 702-0000001
Detail: The SD solution is designed for test, debug, validation, and programming of eMMC, eMCP devices The SD solution provides a co***ct test solution for eMMC, eMCP devices used in applications such as handheld, mobile, and TV prod...

bga169 socket sd solution_14x18mm_premium, emmc socket
Specification: 702-0000061
Detail: The SD solution is designed for test, debug, validation, and programming of eMMC, eMCP devices The SD solution provides a co***ct test solution for eMMC, eMCP devices used in applications such as handheld, mobile, and TV prod...


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