Sireda Technology Co.,Limited

siredatech2010.globa(1)

Showing 21 - 30 of 58, total 6 pages [First] [Previous] [Next] [Last]

bga169 socket usb solution_12x16mm_perform,emmc socket
Specification: 703-0000087
Detail: 1.Test, debug, validation, and programming of eMMC, eMCP devices 2.Failure analysis / System and wafer test 3.Package and Chip qualification 4.Production prototype / Data recover Feature: 1.Suitable for devices of Samsu...

bga153 socket usb solution_11x10mm_perform,emmc programmer
Specification: 703-0000090
Detail: 1.Test, debug, validation, and programming of eMMC, eMCP devices 2.Failure analysis / System and wafer test 3.Package and Chip qualification 4.Production prototype / Data recover Feature: 1.Suitable for devices of Samsu...

bga186 socket usb solution_12x13.5mm_perform,emcp socket
Specification: 703-0000093
Detail: 1.Test, debug, validation, and programming of eMMC, eMCP devices 2.Failure analysis / System and wafer test 3.Package and Chip qualification 4.Production prototype / Data recover Feature: 1.Suitable for devices of Samsu...

bga162 socket usb solution_11.5x13mm_perform,emcp socket
Specification: 703-0000091
Detail: 1.Test, debug, validation, and programming of eMMC, eMCP devices 2.Failure analysis / System and wafer test 3.Package and Chip qualification 4.Production prototype / Data recover Feature: 1.Suitable for devices of Samsu...

bga78 socket f solution_7.5x11mm_premium,ddr3 test socket
Specification: 702-0000240
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,QF...

lga52 socket f solution_12x20mm_premium
Specification: 702-0000227
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga63 socket f solution_9x11mm_premium,emmc test socket
Specification: 702-0000176
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga137 socket f solution_11.5x13mm_premium
Specification: 702-0000286
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga136 socket f solution_12x14mm premium, bga test socket
Specification: 702-0000284
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...

bga170 socket f solution_12x14mm_premium, ddr5 socket
Specification: 702-0000281
Detail: The F solution designed for test, debug, and validation of devices of BGA, LGA, QFP, QFN, SOP, etc. For devices with more than 256 pins, please look for our ¡°U¡± solution. Test, debug, validation of devices of BGA,LGA,Q...


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